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  • 7/31/2019 Contenido de Referencias Bibliograficas 1

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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&conten

    tType=Conference+Publications&queryText%3DRelays

    Innovative, robust and secure industrial solutions using

    microprocessor relaysThis paper appears in:

    Pulp and Paper Industry Technical Conference, 2009. PPIC '09. Conference Record of 2009

    Annual

    Date of Conference: 21-26 June 2009

    Author(s):Seelig, C.W.

    TEAMWORKnet, Inc., Lakeland, FL, USA

    McDermott, B.

    On Page(s): 171 - 180

    Product Type: Conference Publications

    ABSTRACT

    This paper provides real-world examples of the benefits to industrial systems whenaging and obsolete electromechanical relays are replaced with modern,

    microprocessor-based relays. Microprocessor-based relays eliminate failure anddegradation of operations due to moving parts. They also reduce or eliminate thetime to detect a failure via internal self-test diagnostics and monitoring,

    information storage, and communications that immediately publish alarms andalerts. Driving the mean time to detect failures to zero with instantaneous alerts ofself-test alarms dramatically improves the reliability of systems that formerly

    relied on periodic manual tests of devices to detect failure. In fact, any failedelectromechanical devices in service today will remain undetected until they aretested or until they fail to operate while in service. IEC and IEEE reliability

    measures based on time to detect failure and repair or replace are both improvedwith instantaneous detection and notification. In addition to measurably improvedreliability, microprocessor-based relays enable many new and innovative

    applications within industrial and power plant installations. Self- test informationand analytics, sequential events records, event reports, and data and assetcondition monitoring support a wealth of applications. Relay networks share

    information to improve system commissioning and then to manage the plant.Sophisticated load management, load shedding, and voltage regulation are easilydeployed with built-in features of modern, microprocessor-based relays andinformation processors. Programmable automation controllers (PACs) are ruggeddevices with extremely high uptime due to construction methods similar to

    mission-critical relays. Since PACs perform power system and process control logicequally well, new opportunities exist to combine relays and PACs within the samecommunications network to improve power system efficiency and process

    availability. This paper outlines real-- world applications that brought value and

    justification to complete protective relay and PAC upgrades.

    On page(s): 171

    Conference Location : Birmingham, AL

    ISSN : 0190-2172

    E-ISBN : 978-1-4244-3466-4

    Print ISBN: 978-1-4244-3464-0

    INSPEC Accession Number: 10803537

    Digital Object Identifier :

    10.1109/PAPCON.2009.5185421

    Date of Current Version : 31 julio 2009

    Issue Date : 21-26 June 2009

    3

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McDermott,%20B..QT.&newsearch=partialPrefhttp://dx.doi.org/10.1109/PAPCON.2009.5185421http://dx.doi.org/10.1109/PAPCON.2009.5185421http://dx.doi.org/10.1109/PAPCON.2009.5185421http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McDermott,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=C

    onference+Publications&queryText%3DRelays

    Upgrading your protective relays when theory meets reality

    This paper appears in:Protective Relay Engineers, 2010 63rd Annual Conference for

    Date of Conference: March 29 2010-April 1 2010

    Author(s):Sperl, J. Carper, B. ; Coe, W.

    Carper, B. ; Coe, W.

    On Page(s): 1 - 8

    Product Type: Conference Publications

    ABSTRACT

    In theory, it is easy to see the advantage of upgrading a protective relayinstallation from Electro-Mechanical Relays or Solid-State Relays to Modern

    Digital Relays: Required panel space is reduced. Interconnection wiring isreduced. Required maintenance is reduced. Calibration is simpler. Settings canbe changed dynamically. More complex relay schemes are possible. Self-diagnosis is built in. And modern digital relays provide abundantly moreinformation than the previous generation ofrelays supplying data to SCADAsystems, helping document compliance with NERC reliability standards, andestablishing a cornerstone for many smart grid efforts. But when theory meetsreality, an upgrade is never quite as easy as it sounds. Do you still havedrawings from the original installation? Are the wires well-labeled? Is the wire

    insulation still flexible? Do any of your technicians remember how it was actuallyinstalled? Do the new relays fit the old relays' holes? If not, can the panel be

    cut? Do alternate power sources exist such that the circuits can be taken out of

    service during the upgrade? Will your battery plant have the capacity to powerthe modern relays? Is your control building large enough? If not, is itexpandable? All these questions change the equation. The challenges can beovercome, but need to be considered before the project starts.

    Additional Details

    References (3)

    On page(s): 1

    Conference Location : College Station, TX

    Print ISBN: 978-1-4244-6073-1

    INSPEC Accession Number: 11309227

    Digital Object Identifier :10.1109/CPRE.2010.5469500

    Date of Current Version : 20 mayo 2010

    Issue Date : March 29 2010-April 1 2010

    4

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5464130http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5464130http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sperl,%20J..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sperl,%20J..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Carper,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Coe,%20W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Carper,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Coe,%20W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#Referenceshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#Referenceshttp://dx.doi.org/10.1109/CPRE.2010.5469500http://dx.doi.org/10.1109/CPRE.2010.5469500http://dx.doi.org/10.1109/CPRE.2010.5469500http://dx.doi.org/10.1109/CPRE.2010.5469500http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#Referenceshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Coe,%20W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Carper,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Coe,%20W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Carper,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sperl,%20J..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5464130http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5469500&contentType=Conference+Publications&queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType

    =Conference+Publications&queryText%3DRelays

    Innovative, robust and secure industrial solutions using

    microprocessor relays

    This paper appears in:

    Pulp and Paper Industry Technical Conference, 2009. PPIC '09. Conference Record of 2009 Annual

    Date of Conference: 21-26 June 2009

    Author(s):Seelig, C.W. TEAMWORKnet, Inc., Lakeland, FL, USAMcDermott, B.

    On Page(s): 171 - 180

    Product Type: Conference Publications

    ABSTRACT

    This paper provides real-world examples of the benefits to industrial systems whenaging and obsolete electromechanical relays are replaced with modern,microprocessor-based relays. Microprocessor-based relays eliminate failure anddegradation of operations due to moving parts. They also reduce or eliminate thetime to detect a failure via internal self-test diagnostics and monitoring,information storage, and communications that immediately publish alarms andalerts. Driving the mean time to detect failures to zero with instantaneous alerts ofself-test alarms dramatically improves the reliability of systems that formerlyrelied on periodic manual tests of devices to detect failure. In fact, any failedelectromechanical devices in service today will remain undetected until they aretested or until they fail to operate while in service. IEC and IEEE reliability

    measures based on time to detect failure and repair or replace are both improvedwith instantaneous detection and notification. In addition to measurably improvedreliability, microprocessor-based relays enable many new and innovative

    applications within industrial and power plant installations. Self- test informationand analytics, sequential events records, event reports, and data and assetcondition monitoring support a wealth of applications. Relay networks share

    information to improve system commissioning and then to manage the plant.Sophisticated load management, load shedding, and voltage regulation are easilydeployed with built-in features of modern, microprocessor-based relays and

    information processors. Programmable automation controllers (PACs) are ruggeddevices with extremely high uptime due to construction methods similar tomission-critical relays. Since PACs perform power system and process control logic

    equally well, new opportunities exist to combine relays and PACs within the samecommunications network to improve power system efficiency and process

    availability. This paper outlines real-- world applications that brought value andjustification to complete protective relay and PAC upgrades.

    On page(s): 171

    Conference Location : Birmingham, AL

    ISSN : 0190-2172

    E-ISBN : 978-1-4244-3466-4

    Print ISBN: 978-1-4244-3464-0

    INSPEC Accession Number: 10803537

    Digital Object Identifier :

    10.1109/PAPCON.2009.5185421

    Date of Current Version : 31 julio 2009

    Issue Date : 21-26 June 2009

    5

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McDermott,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McDermott,%20B..QT.&newsearch=partialPrefhttp://dx.doi.org/10.1109/PAPCON.2009.5185421http://dx.doi.org/10.1109/PAPCON.2009.5185421http://dx.doi.org/10.1109/PAPCON.2009.5185421http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McDermott,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Seelig,%20C.W..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5173447http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5185421&contentType=Conference+Publications&queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=C

    onference+Publications&pageNumber%3D2%26queryText%3DRelays

    Model Based Design for Power Systems Protection Relays, Using

    Matlab & Simulink

    This paper appears in:Developments in Power System Protection, 2008. DPSP 2008. IET 9th International Conference on

    Date of Conference: 17-20 March 2008

    Author(s):Kirby, B. Areva T&D Autom. & Inf. Syst., StaffordKang, H.

    On Page(s): 654 - 657

    Product Type: Conference Publications

    ABSTRACT

    In the world of power system relays, there have been significant changes in the

    technology used to implement the protection; electro-mechanical relays, staticrelays, digital relays and numerical relays have all been developed to provide

    the required protection and control. However, the development process forthese has by and large remained a manual, document led process. Thisinevitably leads to delays, interpretation errors and omissions which are oftennot identified until late in the process - when it is time consuming and

    expensive to change the design. Furthermore, the design has to be verified andvalidated from requirements through to the final implementation. Manualprocesses make this a laborious and thankless task. By utilising the powerful

    and flexible model based design process allowed by MATLABreg & Simulinkreg,this paper will show how complex and innovative new working methods can bedeveloped to improve the design cycle. These will allow rapid modeling andtesting of algorithms, before committing to the expense of development for thefinal hardware platform, and the resulting cost benefits achieved by avoiding

    late changes to the design. Meanwhile, consistent behaviour can be confirmedand demonstrated at all stages.

    Additional Details

    On page(s): 654

    Conference Location : Glasgow

    ISSN : 0537-9989

    Print ISBN: 978-0-86341-902-7

    INSPEC Accession Number: 10197276

    Date of Current Version : 02 mayo 2008

    Issue Date : 17-20 March 2008

    6

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4496939http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4496939http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kirby,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kirby,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kang,%20H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kang,%20H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kang,%20H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kirby,%20B..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4496939http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4497064&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&c

    ontentType=Conference+Publications&pageNumber%3D2%26queryText%3D

    Relays

    Optimum coordination of overcurrent relays in distribution

    system using genetic algorithm

    This paper appears in:

    Power Systems, 2009. ICPS '09. International Conference on

    Date of Conference: 27-29 Dec. 2009

    Author(s):Bedekar, P.P. Electr. Eng. Dept., Visvesvaraya Nat. Inst. of Technol., Nagpur, India

    Bhide, S.R. ;Kale, V.S.

    On Page(s): 1 - 6

    Product Type: Conference Publications

    ABSTRACT

    This paper presents genetic algorithm (GA) method for coordination of overcurrent

    (OC) relays. The OC relays are the major protection devices in a distributionsystem. OC relay is usually employed as backup protection. But in some situationsit may be the only protection provided. To reduce the power outages, mal-operation of the backup relays should be avoided, and therefore, OC relaycoordination in power distribution network is a major concern of protectionengineer. The OC relay coordination in ring fed distribution networks is a highlyconstrained optimization problem. The purpose is to find an optimum relay settingto minimize the time of operation ofrelays and at the same time, to avoid the mal-operation ofrelays. This paper presents GA technique for optimum coordination of

    OC relays in a ring fed distribution system. Constraints are incorporated in thefitness function making use of the penalty method. Computer programs (usingMATLAB) have been developed for optimum coordination of OC relays using GA

    technique.

    Additional Details

    On page(s): 1

    Conference Location : Kharagpur

    E-ISBN : 978-1-4244-4331-4

    Print ISBN: 978-1-4244-4330-7

    INSPEC Accession Number: 11227159

    Digital Object Identifier :10.1109/ICPWS.2009.5442716

    Date of Current Version : 05 abril 2010

    Issue Date : 27-29 Dec. 2009

    7

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5436187http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5436187http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bedekar,%20P.P..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bedekar,%20P.P..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bedekar,%20P.P..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bhide,%20S.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bhide,%20S.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kale,%20V.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kale,%20V.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ICPWS.2009.5442716http://dx.doi.org/10.1109/ICPWS.2009.5442716http://dx.doi.org/10.1109/ICPWS.2009.5442716http://dx.doi.org/10.1109/ICPWS.2009.5442716http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kale,%20V.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bhide,%20S.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bedekar,%20P.P..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5436187http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5442716&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&conten

    tType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays

    Optimal Overcurrent relays coordination using particle-

    swarm-optimization algorithmThis paper appears in:

    Power Systems Conference and Exposition, 2009. PSCE '09. IEEE/PES

    Date of Conference: 15-18 March 2009

    Author(s):Asadi, M.R.Amirkabir Univ. of Technol., TehranKouhsari, S.M.

    On Page(s): 1 - 7

    Product Type: Conference Publications

    ABSTRACT

    For optimal co-ordination of Overcurrent (OC) relays, linear programmingtechniques such as simplex, two-phase simplex and dual simplex are used.

    Another way of optimal coordination program is using artificial intelligent systemsuch as particle swarm optimization (PSO) algorithm. In this paper a new approachwill be used for optimal coordination of OC relays based on particle swarm

    algorithm. In this work we take into account both time setting multiplier (TSM) andplug setting multiplier (PSM) of OC relays in optimization procedure. Most OCrelays accept only discrete values as TSM and PSM, and you should change your

    final answers to discrete form and this may corrupt the optimization. In this paperthe act of quantizing the answers is taken into account as a part of optimizationprocedure, so the outputs are optimized discrete TSM's and PSM's. In other words

    the novelty of the paper is taking into account the PSM in addition to TSM tohandle miscoordination problems both for continues and discrete TSM and PSM.The results obtained are quite encouraging and will be useful as an effective toolfor coordination OC relays.

    Additional Details

    On page(s): 1

    Conference Location : Seattle, WA

    E-ISBN : 978-1-4244-3811-2

    Print ISBN: 978-1-4244-3810-5

    INSPEC Accession Number: 10614303

    Digital Object Identifier :10.1109/PSCE.2009.4839976

    Date of Current Version : 24 abril 2009

    Issue Date : 15-18 March 2009

    8

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4815087http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4815087http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Asadi,%20M.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Asadi,%20M.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Asadi,%20M.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kouhsari,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kouhsari,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/PSCE.2009.4839976http://dx.doi.org/10.1109/PSCE.2009.4839976http://dx.doi.org/10.1109/PSCE.2009.4839976http://dx.doi.org/10.1109/PSCE.2009.4839976http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kouhsari,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Asadi,%20M.R..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4815087http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4839976&contentType=Conference+Publications&pageNumber%3D2%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&conten

    tType=Conference+Publications&pageNumber%3D4%26queryText%3DRelays

    Hybrid relay selection in heterogenous relay networksThis paper appears in:

    Signals, Systems and Computers (ASILOMAR), 2010 Conference Record of the Forty Fourth

    Asilomar Conference onDate of Conference: 7-10 Nov. 2010

    Author(s):Abouelseoud, M. Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX,

    USANosratinia, A.

    On Page(s): 1864 - 1868

    Product Type: Conference Publications

    ABSTRACT

    In this paper heterogenous networks are envisioned where multiple amplify-forward (AF) and decode-forward (DF) relays coexist. Consider a representativecase with one source, one destination, and multiple relays, where at each point intime a subset (e.g. two) of the relays can be active simultaneously. The questionnaturally arises: how can we select relays for service from among the collection ofavailable relays, and what is the performance of each selection scheme. Wepropose and analyze several selection schemes in a two-relay scenario involving a

    number of ways to synchronously combine AF and DF relays. Expressions foroutage probability in each case are obtained.

    Additional Details

    On page(s): 1864

    Conference Location : Pacific Grove, CA

    ISSN : 1058-6393

    Print ISBN: 978-1-4244-9722-5

    INSPEC Accession Number: 11972851

    Digital Object Identifier :10.1109/ACSSC.2010.5757861

    Date of Current Version : 29 abril 2011

    Issue Date : 7-10 Nov. 2010

    9

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5752164http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5752164http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5752164http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abouelseoud,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abouelseoud,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nosratinia,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nosratinia,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ACSSC.2010.5757861http://dx.doi.org/10.1109/ACSSC.2010.5757861http://dx.doi.org/10.1109/ACSSC.2010.5757861http://dx.doi.org/10.1109/ACSSC.2010.5757861http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nosratinia,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abouelseoud,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5752164http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5752164http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5757861&contentType=Conference+Publications&pageNumber%3D4%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentT

    ype=Conference+Publications&pageNumber%3D5%26queryText%3DRelays

    Current transformer application with digital ground

    differential protection relaysThis paper appears in:

    Industrial and Commercial Power Systems Technical Conference, 2000. Conference Record.

    Papers Presented at the 2000 Annual Meeting. 2000 IEEE

    Date of Conference: 2000

    Author(s):Sutherland, P.E. Power Syst. Energy Consulting, GE Power Syst., Schenectady,

    NY

    On Page(s): 95 - 102

    Product Type: Conference Publications

    ABSTRACT

    Ground differential protection relays (device 87G) have been used to protect thewindings of resistance grounded power transformers. There have been problems of

    relay misoperation and nonoperation with electromechanical 87G relays due to

    current transformer (CT) burden and saturation. Due to their low burden, it hasbeen assumed by some that solid-state digital relays are not subject to these

    problems. The purpose of this paper is to evaluate the truth of this assumption.Under what circumstances, and with what types of CTs, might problems occur? Ananalysis is performed of digital ground differential protection over a range of power

    transformer and CT sizes. Guidelines are developed for CT accuracy ratingssuitable for this application. The effect of different relay algorithms on schemeperformance relative to CTs is also discussed

    Additional Details

    On page(s): 95

    Meeting Date : 07 May 2000-11 May 2000

    Conference Location : Clearwater, FL

    Print ISBN: 0-7803-5843-0

    INSPEC Accession Number: 6643921

    Digital Object Identifier :10.1109/ICPS.2000.854360

    Date of Current Version : 06 agosto 2002

    Issue Date : 2000

    10

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6895http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6895http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6895http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sutherland,%20P.E..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sutherland,%20P.E..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ICPS.2000.854360http://dx.doi.org/10.1109/ICPS.2000.854360http://dx.doi.org/10.1109/ICPS.2000.854360http://dx.doi.org/10.1109/ICPS.2000.854360http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sutherland,%20P.E..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6895http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6895http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=854360&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays
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    Algorithms and hardware design of modern numeric

    overcurrent and distance relaysThis paper appears in:

    Electrical Engineering, 2008. ICEE 2008. Second International Conference on

    Date of Conference: 25-26 March 2008Author(s):Saleem, A.Z. Univ. of Eng. & Technol., LahoreKhan, Z.A. ;Imran, A.

    On Page(s): 1 - 5

    Product Type: Conference Publications

    ABSTRACT

    There has been a significant change in design of protective relays over the pastyears, due to the advancement in microprocessor and signal processingtechnology. Due to the advancements in digital technology and decrease in digital

    hardware prices numeric relays are now available and being used for powersystem protection. This paper describes fundamental design for a numeric relayand presents algorithms to be used for different protection schemes i.e.

    overcurrent protection, distance protection, differential protection.

    Additional Details

    On page(s): 1

    Conference Location : Lahore

    E-ISBN : 978-1-4244-2293-7

    Print ISBN: 978-1-4244-2292-0

    INSPEC Accession Number: 10072130

    Digital Object Identifier :10.1109/ICEE.2008.4553897

    Date of Current Version : 27 junio 2008

    Issue Date : 25-26 March 2008

    11

    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4547431http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4547431http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Saleem,%20A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Saleem,%20A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Khan,%20Z.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Khan,%20Z.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Imran,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Imran,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4553897&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4553897&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ICEE.2008.4553897http://dx.doi.org/10.1109/ICEE.2008.4553897http://dx.doi.org/10.1109/ICEE.2008.4553897http://dx.doi.org/10.1109/ICEE.2008.4553897http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4553897&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Imran,%20A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Khan,%20Z.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Saleem,%20A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4547431
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&conten

    tType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays

    The Power of Modern Relays Enables Fundamental Changes

    in Protection and Control System DesignThis paper appears in:

    Protective Relay Engineers, 2007. 60th Annual Conference for

    Date of Conference: 27-29 March 2007

    Author(s):Thompson, M.

    On Page(s): 71 - 84

    Product Type: Conference Publications

    ABSTRACT

    Modern microprocessor relays are fundamentally different from protective relaytechnologies used in the past. Many paradigms that drove designs in the past are

    no longer valid. This paper describes many design concepts that can be used toimprove the performance, reliability, robustness, and fault tolerance of protectionand control systems. The design concepts that are presented in this paper are

    based upon experience gained in designing and commissioning many fullyintegrated protection and control systems currently in the field. If the design isapproached from the beginning with consideration for integrating protection,

    metering, and control upon a foundation of modern multifunction programmablerelays, we can create a system that has built-in continuous self-test features. Wecan extend the concept of continuous self-test that we have enjoyed in the relays

    themselves to the entire system. The design concepts discussed in this paper canmake problems and failures that would be hidden in a traditional design, readilyapparent so that they can be corrected before undesired operation can occur.These features generally do not require increased cost but are obtained by makinguse of the capabilities available in the powerful relays already being used

    Additional Details

    On page(s): 71

    Conference Location : College Station, TX

    E-ISBN : 1-4244-0995-0

    Print ISBN: 1-4244-0994-2

    INSPEC Accession Number: 9485458

    Digital Object Identifier :10.1109/CPRE.2007.359892

    Date of Current Version : 15 mayo 2007

    Issue Date : 27-29 March 2007

    12

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4201076http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4201076http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Thompson,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Thompson,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/CPRE.2007.359892http://dx.doi.org/10.1109/CPRE.2007.359892http://dx.doi.org/10.1109/CPRE.2007.359892http://dx.doi.org/10.1109/CPRE.2007.359892http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Thompson,%20M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4201076http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4201087&contentType=Conference+Publications&pageNumber%3D5%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&conten

    tType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays

    A new genetic algorithm method for optimal coordination

    of overcurrent and distance relays considering various

    characteristics for overcurrent relaysThis paper appears in:

    Power and Energy Conference, 2008. PECon 2008. IEEE 2nd International

    Date of Conference: 1-3 Dec. 2008

    Author(s):Chabanloo, R.M. Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran

    Abyaneh, H.A. ;Kamangar, S.S.H. ;Razavi, F.

    On Page(s): 569 - 573

    Product Type: Conference Publications

    ABSTRACT

    In this paper, a new genetic algorithm (GA) method is presented to solve theoptimization problem in coordination of overcurrent and distance relays. Theobjective function (OF) is developed in a way that in addition to coordination of

    overcurrent relays, the coordination of overcurrent and distance relays is achieved.Various relay characteristics are considered for each overcurrent relay and the bestof them is selected by GA to fulfill optimal coordination. The proposed method is

    applied to a sample power network. Simulation results demonstrate that themethod can obtain feasible and effective solutions and, it is a promising approachfor optimal coordination in practical power networks.

    Additional Details

    On page(s): 569

    Conference Location : Johor Bahru

    E-ISBN : 978-1-4244-2405-4

    Print ISBN: 978-1-4244-2404-7

    INSPEC Accession Number: 10469342

    Digital Object Identifier :10.1109/PECON.2008.4762540

    Date of Current Version : 27 enero 2009

    Issue Date : 1-3 Dec. 2008

    13

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4752630http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4752630http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chabanloo,%20R.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chabanloo,%20R.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abyaneh,%20H.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abyaneh,%20H.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kamangar,%20S.S.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kamangar,%20S.S.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kamangar,%20S.S.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Razavi,%20F..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Razavi,%20F..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/PECON.2008.4762540http://dx.doi.org/10.1109/PECON.2008.4762540http://dx.doi.org/10.1109/PECON.2008.4762540http://dx.doi.org/10.1109/PECON.2008.4762540http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Razavi,%20F..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kamangar,%20S.S.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abyaneh,%20H.A..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chabanloo,%20R.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4752630http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4762540&contentType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5356435&conten

    tType=Conference+Publications&pageNumber%3D6%26queryText%3DRelays

    Modelling of numerical distance relays using MATLABThis paper appears in:

    Industrial Electronics & Applications, 2009. ISIEA 2009. IEEE Symposium on

    Date of Conference: 4-6 Oct. 2009Author(s):Abdlrahem, A.A. Electr. Eng. Dep, Omer Al-Mokhtar Univ., El-Bida, Libya

    Sherwali, H.H.

    Volume: 1, On Page(s): 389 - 393

    Product Type: Conference Publications

    ABSTRACT

    Numerical relays are the result of the application of microprocessor technology in

    relay industry. Numerical relays have the ability to communicate with its peers, areeconomical and are easy to operate, adjust and repair. Modeling of numerical relayis important to adjust and settle protection equipment in electrical facilities and to

    train protection personnel. Computer models of numerical relays for the study ofprotection systems are greatly enhanced when working along with anElectromagnetic Transient Program (EMTP). This paper describes distance relay

    model built using MATLAB environment. The behavior of the distance relay modelhas been verified using data about different faults generated by theElectromagnetic Transient Program (EMTP-ATP). Data generated by EMTP-ATP

    describes the voltage and current signals at the relay location both immediatelybefore and during the fault. The signals include the DC offset and the highfrequency traveling waves. The data is applied to the relay simulator, which thenevaluates whether the impedance trajectory of the fault enters one or more of theoperating zones. The results are presented in graphical form using an R-Xdiagram. The model is then verified by checking the model impedancemeasurement at different fault locations, and resistive faults. The paperdemonstrates the benefits achieved when using a computer simulation of a relay inconjunction with a transient power system simulation.

    Additional Details

    On page(s): 389

    Conference Location : Kuala Lumpur

    E-ISBN : 978-1-4244-4683-4

    Print ISBN: 978-1-4244-4681-0

    INSPEC Accession Number: 11021380

    Digital Object Identifier :10.1109/ISIEA.2009.5356435

    Date of Current Version : 18 diciembre 2009

    Issue Date : 4-6 Oct. 2009

    14

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    tType=Conference+Publications&pageNumber%3D8%26queryText%3DRelays

    Superiority of PSO Relay Coordination Algorithm over Non-

    Linear Programming: A Comparison, Review and

    VerificationThis paper appears in:

    Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint

    International Conference on

    Date of Conference: 12-15 Oct. 2008

    Author(s):Vijayakumar, D. Dept. of Electr. Eng., Maulana Azad Nat. Inst. of Technol.,

    BhopalNema, R.K.

    On Page(s): 1 - 6

    Product Type: Conference Publications

    ABSTRACT

    Over Current Relays (OCRs) and Directional Over Current Relays (DOCRs) arewidely used for the radial protection and ring sub transmission protection systems

    and for distribution systems. All previous work formulates the DOCR coordinationproblem either as a Linear Programming (LP) problem or as a Non LinearProgramming (NLP) problem or as a Mixed Integer Non Linear Programming(MINLP) Problem or as a Mixed Integer Programming (MIP) problem using

    optimization techniques. In this paper, a Modified Particle Swarm Optimization(MPSO) technique is discussed, reviewed and verified for the optimal settings ofDOCRs in power systems as a NLP problem. The paper also compares MPSO

    algorithm with General Algebraic Modeling System (GAMS). The calculation of theTime Dial Setting (TDS) and the pickup current (Ip) setting of the relays is the

    core of the coordination study. Recently PSO is considered as realistic and powerfulsolution schemes to obtain the global or quasi global optimum in optimization.

    Additional Details

    On page(s): 1

    Conference Location : New Delhi

    E-ISBN : 978-1-4244-1762-9

    Print ISBN: 978-1-4244-1763-6

    INSPEC Accession Number: 10456165

    Digital Object Identifier :10.1109/ICPST.2008.4745385

    Date of Current Version : 09 enero 2009

    Issue Date : 12-15 Oct. 2008

    15

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4723909http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4723909http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4723909http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Vijayakumar,%20D..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Vijayakumar,%20D..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nema,%20R.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nema,%20R.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ICPST.2008.4745385http://dx.doi.org/10.1109/ICPST.2008.4745385http://dx.doi.org/10.1109/ICPST.2008.4745385http://dx.doi.org/10.1109/ICPST.2008.4745385http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nema,%20R.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Vijayakumar,%20D..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4723909http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4723909http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4745385&contentType=Conference+Publications&pageNumber%3D8%26queryText%3DRelays
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    Automatic measurement of electrical parameters of signal

    relaysThis paper appears in:

    Electrical and Control Engineering (ICECE), 2011 International Conference on

    Date of Conference: 16-18 Sept. 2011

    Author(s):Kagra, H. Indian Railways, Mumbai, IndiaSonare, P.

    On Page(s): 84 - 87

    Product Type: Conference Publications

    ABSTRACT

    The manufacturing process of Metal to Carbon relays used in railway signalingsystems for configuring various circuits of signals / points / track circuits etc.

    consists of seven phases from raw material to finished goods. To ensure in-processquality, the electrical parameters are measured manually after each stage. Manualmeasurement process is tedious, error prone and involves lot of time, effort and

    manpower. Besides, it is susceptible to manipulation and may lead to inferiorquality products being passed, either due to deliberation or due to maleficintentions. Due to erroneous measurement of electrical parameters, the functional

    reliability ofrelays is adversely affected. To enhance the trustworthiness ofmeasurement of electrical parameters & to make the process faster, an automatedmeasurement system having proprietary application software and a testing jig

    attachment has been developed. When the relay is fixed on the testing jig, thesoftware scans all the relay contacts and measures all the electrical parametersviz. operating voltage / current, contact resistance, release voltage / current, coilresistance etc. The results are displayed on the computer screen and stored in adatabase file.

    Additional Details

    On page(s): 84

    Conference Location : Yichang

    Print ISBN: 978-1-4244-8162-0

    INSPEC Accession Number: 12342673

    Digital Object Identifier :10.1109/ICECENG.2011.6057433

    Date of Current Version : 24 octubre 2011

    Issue Date : 16-18 Sept. 2011

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    ageNumber%3D9%26queryText%3DRelays

    Operation Logic Proposed for Time Overcurrent RelaysThis paper appears in:

    Power Delivery, IEEE Transactions on

    Date of Publication: Oct. 2007

    Author(s):Conde, A. Univ. Autonoma de Nuevo Leon, LeonVazquez, E.

    Volume: 22,Issue: 4

    On Page(s): 2034 - 2039

    Product Type: Journals & Magazines

    ABSTRACT

    This paper presents a new logic of operation for time overcurrent relays. With theapplication of the proposed technique, the sensitivity of time overcurrent relays isincreased. In order to obtain this, the relay operates with a dynamic pickup

    setting, such as load current. Additionally, fast operation of overcurrent relays is

    obtained. The functional structure is described and the logic of overcurrent relay isevaluated under different operative states. We describe the functional structure of

    the proposed relay and its implementation in laboratory tests.

    Additional Details

    ISSN : 0885-8977

    INSPEC Accession Number: 9633511

    Digital Object Identifier :10.1109/TPWRD.2007.905381

    Date of Current Version : 01 octubre 2007

    Issue Date : Oct. 2007

    Sponsored by :IEEE Power & Energy Society

    17

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    ageNumber%3D10%26queryText%3DRelays

    Determination of overcurrent time delay using fuzzy logic

    relaysThis paper appears in:

    Innovative Technologies in Intelligent Systems and Industrial Applications, 2009. CITISIA

    2009

    Date of Conference: 25-26 July 2009

    Author(s):Bin Zainul Abidin, A.A.Univ. Tenaga Nasional, Kajang, MalaysiaRamasamy, A.K. ;

    Nagi, F.H. ;Bin Zainal Abidin, I.

    On Page(s): 480 - 485

    Product Type: Conference Publications

    ABSTRACT

    The inverse definite minimum time relay has been used in the power distribution

    system in order to protect the system from power system faults. These relays will

    function after a certain time delay when the current going through the relayexceeds a predefined set point. This time delay depends on the ratio of the fault

    current flowing through the relay with the setpoint current defined by theprotection engineer. The basic problem with these relays is that the relays willhave a longer time delay for a less severe fault. Another problem that these relayswould face is when the impedence between the backup relay and the main relay ismuch smaller than the impedence between the fault and the main relay. In thispaper, the possibility of using a fuzzy logic controller (FLC) is studied in order todetermine the time delay of the overcurrent relay.

    Additional Details

    On page(s): 480

    Conference Location : Monash

    E-ISBN : 978-1-4244-2887-8

    Print ISBN: 978-1-4244-2886-1

    INSPEC Accession Number: 10844621

    Digital Object Identifier :10.1109/CITISIA.2009.5224160

    Date of Current Version : 28 agosto 2009

    Issue Date : 25-26 July 2009

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    Impact of harmonics on tripping time of overcurrent relays

    This paper appears in:Power Engineering Conference, 2007. AUPEC 2007. Australasian UniversitiesDate of Conference: 9-12 Dec. 2007Author(s):Masoum, M.A.S. Dept. of Electr. & Comput. Eng., Curtin Univ. of Technol., Perth,WA;Islam, S.M. ;Tan, K. ;Xuan, T.N.On Page(s): 1 - 5Product Type: Conference Publications

    ABSTRACT

    Theoretical and experimental analyses are used to investigate the effects ofharmonics on the operation of overcurrent relays. Two analytical approaches basedon relay characteristics provided by the manufacturer and simulations using

    PSCAD software package are used to estimate tripping times under non-sinusoidaloperating conditions. The tests were conducted such that the order and themagnitude of harmonics could be controlled by employing a computer-based

    single-phase harmonic source. Computed and measured tripping times arecompared and suggestions on the application of overcurrent relays in harmonicallypolluted environments are provided.

    Additional Details

    On page(s): 1

    Conference Location : Perth, WA

    E-ISBN : 978-0-646-49499-1

    Print ISBN: 978-0-646-49488-3

    INSPEC Accession Number: 10044374

    Digital Object Identifier :10.1109/AUPEC.2007.4548125

    Date of Current Version : 20 junio 2008

    Issue Date : 9-12 Dec. 2007

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    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4542677http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4542677http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Masoum,%20M.A.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Masoum,%20M.A.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Islam,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Islam,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Islam,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tan,%20K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tan,%20K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tan,%20K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xuan,%20T.N..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xuan,%20T.N..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4548125&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D14%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4548125&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D14%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/AUPEC.2007.4548125http://dx.doi.org/10.1109/AUPEC.2007.4548125http://dx.doi.org/10.1109/AUPEC.2007.4548125http://dx.doi.org/10.1109/AUPEC.2007.4548125http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=4548125&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D14%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xuan,%20T.N..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tan,%20K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Islam,%20S.M..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Masoum,%20M.A.S..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4542677
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&conten

    tType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26p

    ageNumber%3D15%26queryText%3DRelays

    Modelling of overcurrent relay using digital signal

    processor

    This paper appears in:Industrial Electronics & Applications (ISIEA), 2010 IEEE Symposium onDate of Conference: 3-5 Oct. 2010Author(s):Yin Lee Goh Dept. of Electron. &, Commun. Eng., Univ. Tenaga Nasional, Kajang, MalaysiaRamasamy, A.K. ;Abidin, A.A.Z. ;Nagi, F.H.On Page(s): 367 - 370Product Type: Conference Publications

    ABSTRACT

    Protective relays are used to detect any abnormalities in a power system andisolate the faulty section of the system in the shortest time, in order to minimize

    disturbances caused by failure in the system to ensure continuous power delivery.Protective relays for overcurrent protection are the most widely used relays in apower system. The implementation of overcurrent relay on digital signal processor

    (DSP) proficient to mitigate problems such as lack of memory capacity, lowerspeed and functionality, compared to conventional approach using microprocessor.The modelling of overcurrent relay for inverse definite minimum time (IDMT) type

    using DSP board TMS320F2812 will be discussed in the paper. Simulation resultsof the overcurrent relay from MATLAB/ Simulink and execution on TMS320F2812will be presented.

    Additional Details

    On page(s): 367

    Conference Location : Penang

    Print ISBN: 978-1-4244-7645-9

    INSPEC Accession Number: 11746682

    Digital Object Identifier :10.1109/ISIEA.2010.5679440

    Date of Current Version : 06 enero 2011

    Issue Date : 3-5 Oct. 2010

    20

    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5672644http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5672644http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yin%20Lee%20Goh.QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yin%20Lee%20Goh.QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ramasamy,%20A.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ramasamy,%20A.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abidin,%20A.A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abidin,%20A.A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abidin,%20A.A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nagi,%20F.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nagi,%20F.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelays#AdditionalDetailshttp://dx.doi.org/10.1109/ISIEA.2010.5679440http://dx.doi.org/10.1109/ISIEA.2010.5679440http://dx.doi.org/10.1109/ISIEA.2010.5679440http://dx.doi.org/10.1109/ISIEA.2010.5679440http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelays#AdditionalDetailshttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nagi,%20F.H..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abidin,%20A.A.Z..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ramasamy,%20A.K..QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yin%20Lee%20Goh.QT.&newsearch=partialPrefhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5672644http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelayshttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5679440&contentType=Conference+Publications&ranges%3D2007_2012_p_Publication_Year%26pageNumber%3D15%26queryText%3DRelays
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    http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5510137&conten

    tType=Journals+%26+Magazines&ranges%3D2007_2012_p_Publication_Year%26p

    ageNumber%3D19%26queryText%3DRelays

    A Transfer-Function-Based Thermal Model Reduction Study

    for Induction Machine Thermal Overload Protective RelaysThis paper appears in:

    Industry Applications, IEEE Transactions on

    Date of Publication: Sept.-Oct. 2010

    Author(s):Pinjia Zhang Electr. Machines Lab., Gen. Electr. (GE) Global Res., Niskayuna, NY,

    USAYi Du ;Habetler, T.G.

    Volume: 46,Issue: 5

    On Page(s): 1919 - 1926

    Product Type: Journals & Magazines

    ABSTRACT

    High-order induction machine thermal models have been widely studied for the

    analysis of the thermal behavior of induction machines. However, the real-time

    implementation of such models for the online thermal protection of inductionmachines is very difficult due to the lack of accurate information on the machines.

    This paper proposes a novel simplified thermal model of induction machines forthermal overload relays. Instead of using a lumped thermal network, a transfer-function-based approach is proposed for reducing the order of induction machinethermal models. The proposed thermal model requires significantly fewer thermalparameters for the accurate modeling of the thermal behavior of the machine. Theproposed thermal model is validated via experimental results on a 7.5-hp open-drip-proof induction machine under various load conditions. The major features ofthe proposed thermal model are the following: 1) high accuracy of the statorwinding temperature estimation, with a root-mean-square error within 3C; 2) lowcomputational requirement, which reduces the cost of thermal overload relays;

    and 3) easy implementation since only current sensors are required.

    Additional Details

    ISSN : 0093-9994

    INSPEC Accession Number: 11527710

    Digital Object Identifier :10.1109/TIA.2010.2058831

    Date of Publication : 15 julio 2010

    Date of Current Version : 16 septiembre 2010

    Issue Date : Sept.-Oct. 2010

    Sponsored by :IEEE Industry Applications Society

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